The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2017
Filed:
Jul. 15, 2014
Solarwinds Worldwide, Llc, Austin, TX (US);
Karlo Martin Zatylny, Dripping Springs, TX (US);
Lukas Belza, Kvasice, CZ;
Martin Susil, Brno, CZ;
Zeid Adly Derhally, Washington, DC (US);
Susan Allison Chopra, Austin, TX (US);
SOLARWINDS WORLDWIDE, LLC, Austin, TX (US);
Abstract
A method and apparatus can be configured to receive a data set of values relating to a process. The data set of values correspond to values measured while the process is performed over a duration of time. The method also includes performing first statistical calculations on a first data subset of values. The values of the first data subset is a subset of the entire received data set of values. The values of the first data subset of values correspond to values that are of a first timeframe of the duration of time. The method also includes displaying first calculated results of the first statistical calculations. The method also includes determining whether performing the process has crossed a first threshold baseline. The first threshold baseline is based on the first statistical calculations. The method also includes transmitting a first alert to a user if the process is determined to have crossed the first threshold baseline.