The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2017
Filed:
Sep. 29, 2014
National Instruments Corporation, Austin, TX (US);
Richard Henry Mace Keene, Gwent, GB;
Jan Viborg Moeller, Greve, DK;
NATIONAL INSTRUMENTS CORPORATION, Austin, TX (US);
Abstract
System and method for controlling a custom modular measurement system. An editor may receive user input specifying one or more system definitions, each mapping message based commands, parameters, variables and/or metadata ('information') accordant with a control protocol for standalone instruments to functions and data in a programming language, and generates the definitions accordingly, each being useable by a client application to interface with a custom modular measurement system that includes multiple logical instruments via the message based information. At least one of the definitions may be deployed onto the measurement system. A run-time engine of the measurement system may accept a message based command from the application, and call a corresponding function, which may invoke operation of at least one of the logical instruments. The logical instruments may be operated concurrently, including sharing use of a single physical measurement device by at least two of the logical instruments.
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