The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2017
Filed:
Feb. 26, 2014
Olympus Corporation, Shibuya-ku, Tokyo, JP;
Nobuhiro Takamizawa, Kanagawa, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
Unnecessary degradation of a light detector is prevented. Provided is a microscope apparatus () including: a scanner () that that performs scanning of illumination light emitted from a light source () on a specimen in two directions intersecting each other; an objective lens () that collects fluorescence produced in the specimen; a dispersive element () that disperses the fluorescence collected by the objective lens () into spectral components; a multichannel detector () that has a plurality of cells () for detecting the spectral components obtained through the dispersion performed by the dispersive element (); a grouping control section () that groups the plurality of cells () of the multichannel detector () into a used group and an unused group; and a sensitivity control section () that turns off the sensitivities of the cells that are grouped into the unused group by the grouping control section () or reduces the sensitivities thereof with respect to the sensitivities of the cells that are grouped into the used group.