The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2017
Filed:
Jun. 30, 2014
Andrey Kuznetsov, St. Petersburg, RU;
Valery Averyanov, St. Petersburg, RU;
Stanislav Vorobyev, St. Petersburg, RU;
Igor Gorshkov, St. Petersburg, RU;
Andrey Kuznetsov, St. Petersburg, RU;
Valery Averyanov, St. Petersburg, RU;
Stanislav Vorobyev, St. Petersburg, RU;
Igor Gorshkov, St. Petersburg, RU;
APSTEC SYSTEMS LTD, Iklin, MT;
Abstract
A method for standoff detection and analysis of objects comprises sending a signal through an inspection area, from a transmitter to a receiver, wherein the signal travels through objects in its path. If the signal encounters an object, through which it must travel, the speed of signal distribution decreases and its amplitude drops. A processor then determines the amplitude of the signal and whether the amplitude is above a given threshold, and if the threshold is met, further determining the shift in length of the signal's optical path, determining the thickness of the object, calculating the dielectric permittivity constant, and comparing this constant to known values of different materials to determine a preselected group of materials, to which the object in the inspection area belongs, and whether the inspected object belongs to a preselected group of dangerous objects. A system for detecting and analyzing such materials is also disclosed.