The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2017
Filed:
Aug. 19, 2015
Decision Sciences International Corporation, Poway, CA (US);
Gary Blanpied, Ramona, CA (US);
Michael James Sossong, Ramona, CA (US);
Shawn McKenney, Ramona, CA (US);
Thomas Taylor, St. Johns, FL (US);
Kolo Wamba, San Diego, CA (US);
Decision Sciences International Corporation, Poway, CA (US);
Abstract
A charged particle detector array includes one or more pairs of super modules, one super module in a pair of super modules is positioned above a volume of interest (VOI), and the other super module in the pair of super modules is positioned below the VOI. This calibration technique first calibrates individual super modules in the one or more pairs of super modules while treating each super module being calibrated as a rigid body. Each super module in the one or more pairs of super modules further includes multiple vertically-stacked modules, and each module in the multiple vertically-stacked modules is composed of multiple layers of drift tubes. The calibration technique then calibrates individual modules in each of the super modules while treating each module being calibrated as a rigid body. Next, the calibration technique calibrates individual drift tubes in each layer of the modules.