The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9784800 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 10, 2017

Filed:

Apr. 28, 2014
Applicant:

Fujikura Ltd., Koto-ku, Tokyo, JP;

Inventor:

Yasushi Oikawa, Sakura, JP;

Assignee:

FUJIKURA LTD., Koto-ku, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/04 (2006.01);
U.S. Cl.
CPC ...
G01R 33/04 (2013.01);
Abstract

An inspection circuit serves as a pseudo circuit of a flux gate-type magnetic element having an excitation coil and a detection coil and inspects a magnetic field detector that detects a magnetic field based on an output of the magnetic element when detecting an intensity of a stationary magnetic field applied to the magnetic element based on a time-resolved magnetic balance type. The magnetic field detector includes: an excitation signal generation unit, a detection signal comparison unit, a feedback signal conversion unit, a feedback signal adjustment unit, a data signal conversion unit, and an excitation signal adjustment unit.


Find Patent Forward Citations

Oikawa, Yasushi. (2017). Inspection circuit for magnetic field detector, and inspection method for the same (U.S. Patent No. 9784800). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9784800

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