The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2017
Filed:
Jul. 11, 2013
Applicant:
Commissariat À L'énergie Atomique ET Aux Énergies Alternatives, Paris, FR;
Inventor:
Haykel Ben Jamaa, Grenoble, FR;
Assignee:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); H01L 21/66 (2006.01); G01R 1/20 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2853 (2013.01); G01R 1/20 (2013.01); H01L 22/14 (2013.01); H01L 22/34 (2013.01); H01L 2924/0002 (2013.01);
Abstract
A simultaneous electrical testing device for TSV interconnection elements passing through a substrate and including one end connected to an integrated testing circuit and another end to a removable connection mechanism assembled to the substrate through an anisotropic conductive glue.
Ben Jamaa, Haykel. (2017). Device for electrically testing the interconnections of a microelectronic device (U.S. Patent No. 9784786). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9784786
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile