The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2017

Filed:

Feb. 06, 2013
Applicant:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Inventors:

Céline Fiorini, Orsay, FR;

Fabrice Charra, Marcoussis, FR;

Ludovic Douillard, Antony, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 70/12 (2010.01); G01Q 60/22 (2010.01); G01Q 60/20 (2010.01);
U.S. Cl.
CPC ...
G01Q 60/22 (2013.01); G01Q 60/20 (2013.01);
Abstract

The invention relates to an active probe for near-field optical microscopy, characterized in that it includes a metal or metallized tip (PM) at the apex of which a nanoscale body (NB) is located, the body having a polymer matrix capable of, or containing a host (MH) capable of, emitting under illumination, light (SH) at a wavelength different from that of the illumination. A process for manufacturing such a probe is also provided.


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