The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2017
Filed:
May. 13, 2014
Applicant:
The General Hospital Corporation, Boston, MA (US);
Inventors:
Johannes F. de Boer, Amstelveen, NL;
Mattijs De Groot, Haarlem, NL;
Assignee:
The General Hospital Corporation, Boston, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G01J 3/453 (2006.01); G01J 3/02 (2006.01); G01J 3/433 (2006.01); G01J 3/44 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6458 (2013.01); G01J 3/0218 (2013.01); G01J 3/433 (2013.01); G01J 3/4406 (2013.01); G01J 3/453 (2013.01); G01J 3/4532 (2013.01); G01J 3/4537 (2013.01); G01N 21/6486 (2013.01); G01N 21/4795 (2013.01); G01N 2021/6463 (2013.01); G01N 2021/6484 (2013.01);
Abstract
Systems and methods according to exemplary embodiments of the present disclosure can be provided that can efficiently detect the amplitude and phase of a spectral modulation. Such exemplary scheme can be combined with self-interference fluorescence to facilitate a highly sensitive depth localization of self-interfering radiation generated within a sample. The exemplary system and method can facilitate a scan-free depth sensitivity within the focal depth range for microscopy, endoscopy and nanoscopy.