The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2017

Filed:

Aug. 27, 2013
Applicant:

The University of Tokyo, Tokyo, JP;

Inventors:

Kazuo Hotate, Tokyo, JP;

Rodrigo K. Yamashita, Tokyo, JP;

Zuyuan He, Tokyo, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01M 11/00 (2006.01); G01D 5/353 (2006.01);
U.S. Cl.
CPC ...
G01M 11/3181 (2013.01); G01D 5/35364 (2013.01); G01M 11/39 (2013.01);
Abstract

There are proposed an optical fiber property measuring device and an optical fiber property measuring method which can enhance spatial resolution more than before. In the present invention, in synchronization with frequency modulation applied to x-polarized light, intensity modulation is also applied to the x-polarized light by an intensity modulation means. This makes it possible to increase or decrease the intensity of the x-polarized light at a specific frequency, thereby allowing the effective length of a Brillouin dynamic grating formed by the x-polarized light to be adjusted. As a result, the shape of the reflection spectrum obtained when y-polarized light is reflecting by the Brillouin dynamic grating can also be adjusted optimally, which leads to enhancement of spatial resolution with the y-polarized light.


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