The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2017
Filed:
Jan. 20, 2016
Applicant:
Phase Focus Limited, Sheffield, South Yorkshire, GB;
Inventors:
Martin James Humphry, Long Eaton, GB;
Kevin Langley, Sheffield, GB;
James Russell, Long Eaton, GB;
Andrew Michael Maiden, Sheffield, GB;
Assignee:
PHASE FOCUS LIMITED, Sheffield, South Yorkshire, GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/00 (2006.01); G01M 11/02 (2006.01); G01B 11/24 (2006.01); G01B 11/06 (2006.01); G01N 21/41 (2006.01); G01M 11/08 (2006.01);
U.S. Cl.
CPC ...
G01M 11/0235 (2013.01); G01B 11/06 (2013.01); G01B 11/24 (2013.01); G01M 11/025 (2013.01); G01M 11/0228 (2013.01); G01M 11/08 (2013.01); G01N 21/41 (2013.01); G01N 2201/12 (2013.01);
Abstract
Embodiments of the invention provide a method of determining one or more characteristics of a target object, comprising recording one or more diffraction patterns at a detector, wherein each diffraction pattern is formed by a target object scattering incident radiation, determining a phase map for at least a region of the target object based on the one or more diffraction patterns, and determining a refractive property of the target object based on the phase map.