The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2017
Filed:
Oct. 21, 2015
National Institute of Advanced Industrial Science and Technology, Tokyo, JP;
Microtracbel Corporation, Osaka, JP;
Akira Endo, Tsukuba, JP;
Marie Shimomura, Tsukuba, JP;
Satoshi Taniguchi, Tsukuba, JP;
Kazuyuki Nakai, Toyonaka, JP;
Masayuki Yoshida, Toyonaka, JP;
Makoto Okawa, Toyonaka, JP;
National Institute of Advanced Industrial Science and Technology, Tokyo, JP;
MicrotracBEL Corp., Osaka, JP;
Abstract
An adsorption characteristic measuring apparatus is configured to: acquire a unit-time leak pressure value from a pressure increase value of an internal pressure value of a sample tube caused by an non-adsorption gas leaking from the outside of a fitting portion into an inner space of the sample tube; acquire a pressure value at which a temporal change of the internal pressure value of the sample tube assumes an equilibrium state when an adsorption gas present in the reference volume portion is supplied into the sample tube and the sample tube is in a closed state; calculate a pressure value after correction of a real leak pressure value is performed on a measured equilibrium pressure value, as a true equilibrium pressure value, the real leak pressure value being obtained in such a manner that the unit-time leak pressure value is multiplied by a leak time; and calculate an adsorption isotherm.