The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2017

Filed:

Nov. 28, 2016
Applicant:

Bayspec, Inc., San Jose, CA (US);

Inventors:

Guocai Shu, Pleasanton, CA (US);

Shu Zhang, Fremont, CA (US);

William Yang, Fremont, CA (US);

Assignee:

BaySpec, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/02 (2006.01); G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
G01J 3/0289 (2013.01); G01J 3/2823 (2013.01); G01J 2003/283 (2013.01);
Abstract

Systems for adjusting for irregular movement during spectral imaging are provided herein. Exemplary systems include: a spectrograph measuring a plurality of spectrographic data sets; a camera capturing images, a processor communicatively coupled to the spectrograph and the camera; and a memory coupled to the processor, the memory storing instructions executable by the processor to perform a method comprising: receiving a plurality of spectrographs for a series of respective locations and the images corresponding to the respective locations; generating a continuous image using the images; identifying a respective corresponding position in the continuous image for each spectrograph, such that each spectrograph is a measurement of the respective position; and associating each spectrograph with the respective position.


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