The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2017

Filed:

Dec. 11, 2015
Applicant:

Arkray, Inc., Kyoto, JP;

Inventor:

Hirohisa Uchida, Kyoto, JP;

Assignee:

ARKRAY, Inc., Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/08 (2006.01); G01J 1/42 (2006.01); G01J 1/02 (2006.01); G01N 21/03 (2006.01); G01N 21/35 (2014.01); G01N 21/3577 (2014.01); G01N 21/3581 (2014.01); G01N 21/05 (2006.01);
U.S. Cl.
CPC ...
G01J 1/08 (2013.01); G01J 1/0223 (2013.01); G01J 1/42 (2013.01); G01N 21/03 (2013.01); G01N 21/3577 (2013.01); G01N 21/3581 (2013.01); G01N 2021/058 (2013.01);
Abstract

There is provided a terahertz wave measuring device including (1) a terahertz wave generation element that generates a terahertz wave by difference frequency generation based on excitation light that is incident to the terahertz wave generation element, the excitation light including a plurality of different wavelength components and being condensed so as to have a beam diameter of a predetermined size, (2) a structural body through which the terahertz wave is transmitted; and (3) a detector that detects an intensity of the terahertz wave that has been transmitted through the structural body, wherein the structural body includes a sample holder of a predetermined width that holds a sample, and the structural body is in close contact with or is joined to the terahertz wave generation element.


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