The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2017
Filed:
Nov. 19, 2015
Applicant:
Quality Vision International, Inc., Rochester, NY (US);
Inventors:
Frederick D. Schwab, Atlanta, NY (US);
Edward T. Polidor, Webster, NY (US);
Assignee:
Quality Vision International, Inc., Rochester, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G01B 5/012 (2006.01);
U.S. Cl.
CPC ...
G01B 11/022 (2013.01); G01B 5/012 (2013.01);
Abstract
An optical measurement system includes an optical sensor assembly for measuring an object located beneath the optical sensor assembly. A deployment mechanism is pivotally connected relative to the optical sensor assembly that moves a secondary measurement aid, such as a touch sensor, between a deployed position and a retracted position. When in the retracted position, the secondary measurement aid does not inhibit movement of the optical sensor with respect to the object being measured.