The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2017
Filed:
Sep. 03, 2010
Applicants:
Alan R. Stanford, Eaton, OH (US);
David C. Woo, Foster City, CA (US);
John David Morgenthaler, Menlo Park, CA (US);
Inventors:
Alan R. Stanford, Eaton, OH (US);
David C. Woo, Foster City, CA (US);
John David Morgenthaler, Menlo Park, CA (US);
Assignee:
Applied Biosystems, LLC, Carlsbad, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 17/38 (2006.01); G01B 11/00 (2006.01); G01B 11/26 (2006.01); B01L 9/00 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/002 (2013.01); G01B 11/26 (2013.01); B01L 9/523 (2013.01); G01N 35/00584 (2013.01);
Abstract
Systems and methods are provided that comprise calibration techniques and associated systems that identify the two-dimensional position, or other alignment or positioning, of sample wells or other calibration objects located in a sample well plate, or other surface or area of interest. In some embodiments, calibration of the plate and/or positioning and/or alignment with respect to detection optics can be performed in multiple stages for two or more dimensions.