The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2017
Filed:
Sep. 03, 2010
Alan R. Stanford, Eaton, OH (US);
David C. Woo, Foster City, CA (US);
John David Morgenthaler, Menlo Park, CA (US);
Alan R. Stanford, Eaton, OH (US);
David C. Woo, Foster City, CA (US);
John David Morgenthaler, Menlo Park, CA (US);
Applied Biosystems, LLC, Carlsbad, CA (US);
Abstract
Systems and methods are provided that comprise calibration techniques and associated systems that identify the two-dimensional position, or other alignment or positioning, of sample wells or other calibration objects located in a sample well plate, or other surface or area of interest. In some embodiments, calibration of the plate and/or positioning and/or alignment with respect to detection optics can be performed in multiple stages for two or more dimensions.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile