The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2017

Filed:

Feb. 27, 2014
Applicant:

Thorlabs, Inc., Newton, NJ (US);

Inventors:

James Y. Jiang, Hackettstown, NJ (US);

Scott Barry, Lafayette, NJ (US);

Alex E. Cable, Newton, NJ (US);

Assignee:

Thorlabs, Inc., Newton, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02027 (2013.01); G01B 9/02004 (2013.01); G01B 9/02069 (2013.01); G01B 9/02091 (2013.01);
Abstract

An optical imaging system includes an optical radiation source (), a frequency clock module outputting frequency clock signals (), an optical interferometer (), a data acquisition (DAQ) device () triggered by the frequency clock signals, and a computer () to perform multi-dimensional optical imaging of the samples. The frequency clock signals are processed by software or hardware to produce a record containing frequency-time relationship of the optical radiation source () to externally clock the sampling process of the DAQ device (). The system may employ over-sampling and various digital signal processing methods to improve image quality. The system further includes multiple stages of routers () connecting the light source () with a plurality of interferometers (a-n) and a DAQ system () externally clocked by frequency clock signals to perform high-speed multi-channel optical imaging of samples.


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