The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2017

Filed:

Aug. 23, 2016
Applicant:

Kyocera Document Solutions Inc., Osaka-shi, Osaka, JP;

Inventor:

Shingo Yoshida, Osaka, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 2/44 (2006.01); G03G 15/04 (2006.01); G03G 15/043 (2006.01); G03G 15/08 (2006.01);
U.S. Cl.
CPC ...
B41J 2/44 (2013.01); G03G 15/0435 (2013.01); G03G 15/04036 (2013.01); G03G 15/0879 (2013.01); G03G 2215/0132 (2013.01);
Abstract

An optical scanning device includes a light source, a deflector, and a plurality of scanning lenses. A scanning lens lying closest to the deflector has a positive refractive power and the incident surface of it allows the oblique angle θ of the light beam entering the incident surface to vary from a center to an end of the incident surface. The incident surface satisfies the following conditions, where Δθ is the amount of change and dθ is the rate of change in the oblique angle θ of the light beam in the main scanning direction, dθ is the rate of change in dθ, and Δθ is the amount of change in Δθ:


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