The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2017

Filed:

Nov. 24, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Yann A. Astier, Irvington, NY (US);

Markus Brink, White Plains, NY (US);

Michael F. Lofaro, Brookfield, CT (US);

Joshua T. Smith, Croton on Hudson, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/311 (2006.01); B01L 3/00 (2006.01); B81C 1/00 (2006.01); B24B 37/04 (2012.01); G01N 27/447 (2006.01); G01N 33/487 (2006.01); G01N 30/74 (2006.01); G01N 30/60 (2006.01); G01N 30/88 (2006.01);
U.S. Cl.
CPC ...
B01L 3/502707 (2013.01); B01L 3/502753 (2013.01); B01L 3/502761 (2013.01); B24B 37/042 (2013.01); B81C 1/00087 (2013.01); G01N 27/44791 (2013.01); G01N 33/48721 (2013.01); B01L 2200/0652 (2013.01); B01L 2200/12 (2013.01); B01L 2300/0681 (2013.01); B01L 2300/0858 (2013.01); B01L 2300/0887 (2013.01); B01L 2300/0896 (2013.01); B81C 2201/013 (2013.01); B81C 2201/0104 (2013.01); G01N 30/6039 (2013.01); G01N 30/74 (2013.01); G01N 2030/885 (2013.01);
Abstract

A technique relates to a nanogap array. A substrate has been anisotropically etched with trenches that have tapered sidewalls. A sacrificial layer is on bottoms and the tapered sidewalls of the trenches. A filling material is formed on top of the sacrificial layer in the trenches. Nanogaps are formed where at least a portion of the sacrificial layer has been removed from the tapered sidewalls of the trenches while the sacrificial layer remains on the bottoms of the trenches. Each of the nanogaps is formed between one tapered sidewall of the substrate and a corresponding tapered sidewall of the filling material. The one tapered sidewall of the substrate opposes the corresponding tapered sidewall. A capping layer is disposed on top of the substrate and the filling material, such that the nanogaps are covered but not filled in.


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