The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2017
Filed:
Jun. 01, 2015
Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;
Tomofumi Yamanashi, Kanagawa, JP;
Hidekazu Araki, Fukushima, JP;
Abstract
A wrinkle detection apparatus is an apparatus for detecting a wrinkle area of skin included in an image. The wrinkle detection apparatus includes a first threshold processing unit that detects a first edge area included in the image by performing first threshold processing for comparing a gradient value that indicates a degree of change in pixel values in the image with a first threshold, a second threshold processing unit that detects a second edge area included in the image by performing second threshold processing for comparing the gradient value with a second threshold, and an edge selection processing unit that determines a wrinkle area based on an overlapping area in which the first edge area and the second edge area are overlapped.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile