The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2017

Filed:

Aug. 08, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Rachele S. Kurtz, Cary, NC (US);

Charles S. Lingafelt, Durham, NC (US);

James W. Murray, Durham, NC (US);

James T. Swantek, Canton, GA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 40/00 (2009.01); H04W 16/20 (2009.01); H04W 24/02 (2009.01); H04W 84/12 (2009.01); H04W 88/08 (2009.01);
U.S. Cl.
CPC ...
H04W 16/20 (2013.01); H04W 24/02 (2013.01); H04W 84/12 (2013.01); H04W 88/08 (2013.01);
Abstract

Embodiments for testing a wireless network location by a processor. A collection of candidate wireless network test locations is selected for testing wireless network communication according to defined constraints, conditions, testing parameters, or a combination thereof. A self-directed, mobile wireless access point (WAP) is dispatched to at least one stationary location from the collection. A self-directed, testing receiver may be commanded to progressively move to each candidate test location along a testing route of the collection. The testing attributes relating to wireless network communication performance are measured for each of the candidate test locations along the testing route of the collection. Qualified WAP locations are identified from the candidate test locations based on the measured testing attributes.


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