The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2017

Filed:

Feb. 04, 2015
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Xue Tu, Fremont, CA (US);

Pingshan Li, Sunnyvale, CA (US);

Alexander Berestov, San Jose, CA (US);

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); G01B 9/00 (2006.01); G02B 15/14 (2006.01); G06T 7/80 (2017.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01); G06T 7/80 (2017.01);
Abstract

The thick lens calibration method enables better calibration of complex camera devices such as devices with thick lens systems. The thick lens calibration method includes a two step process of calibrating using the distance between a second nodal point and an image sensor, and calibrating using the distance between the first and second nodal point.


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