The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2017
Filed:
Aug. 05, 2016
Applicant:
Electronics and Telecommunications Research Institute, Daejeon, KR;
Inventors:
Ik Soo Eo, Daejeon, KR;
Sang-Kyun Kim, Daejeon, KR;
Cheon Soo Kim, Daejeon, KR;
Jang Hong Choi, Daejeon, KR;
Assignee:
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE, Daejeon, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/38 (2015.01); H04L 5/16 (2006.01); H04B 17/14 (2015.01); H04L 1/24 (2006.01);
U.S. Cl.
CPC ...
H04B 17/14 (2015.01); H04L 1/243 (2013.01);
Abstract
A method and device for calibrating a DC offset and an I-Q imbalance component of an RF transceiver, the method including inputting a test signal into a transmitter, and converting the test signal into an analogue test signal; converting the analogue test signal using a transmitting mixer; sub-sampling a signal output from the transmitting mixer; and computing a DC offset calibrating constant number and an I-Q imbalance calibrating constant number from a sub-sampled signal.