The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2017

Filed:

Jul. 09, 2014
Applicant:

Panasonic Corporation, Osaka, JP;

Inventors:

Yoichi Shintani, Osaka, JP;

Tatsuhiro Tomiyama, Miyagi, JP;

Yasutaka Tsutsui, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 51/52 (2006.01); H01L 51/50 (2006.01); H01L 51/56 (2006.01);
U.S. Cl.
CPC ...
H01L 51/5259 (2013.01); H01L 51/5012 (2013.01); H01L 51/5234 (2013.01); H01L 51/5253 (2013.01); H01L 51/56 (2013.01);
Abstract

An organic EL device includes: an organic EL layer; and a hygroscopic layer that is disposed above and/or below the organic EL layer, and has a hygroscopic film, a first covering film, and a second covering film, the first covering film covering one of main surfaces of the hygroscopic film, the second covering film covering the other main surface of the hygroscopic film, wherein a relational expression A/B≧0.2 is satisfied, where A denotes hygroscopicity indicating mass of moisture, expressed in g/m, that is absorbable by the hygroscopic film per unit of area, and B denotes the number of defects per unit of area, expressed in pieces/mm, that is calculated based on the number of defects in each of the first covering film and the second covering film.


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