The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2017
Filed:
Jul. 25, 2014
Applicant:
E.a. Fischione Instruments, Inc., Export, PA (US);
Inventors:
Paul E. Fischione, Export, PA (US);
Michael F. Boccabella, North Huntington, PA (US);
Assignee:
E.A. Fischione Instruments, Inc., Export, PA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/305 (2006.01); H01J 37/20 (2006.01); H01J 37/28 (2006.01); H01J 37/29 (2006.01); H01J 37/304 (2006.01);
U.S. Cl.
CPC ...
H01J 37/3056 (2013.01); H01J 37/20 (2013.01); H01J 37/28 (2013.01); H01J 37/292 (2013.01); H01J 37/304 (2013.01); H01J 2237/30466 (2013.01); H01J 2237/31745 (2013.01); H01J 2237/31749 (2013.01);
Abstract
An apparatus for preparing a sample for microscopy is provided that has a milling device that removes material from a sample in order to thin the sample. An electron beam that is directed onto the sample is present along with a detector that detects when the electron beam has reached a preselected threshold transmitted through or immediately adjacent the sample. Once the detector detects the electron beam has reached this threshold, the milling device terminates the milling process.