The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2017
Filed:
Dec. 26, 2014
Deere and Company, Moline, IL (US);
Carnegie Mellon University, Pittsburgh, PA (US);
Carl Knox Wellington, Pittsburgh, PA (US);
Aaron J. Bruns, Bettendorf, IA (US);
Victor S. Sierra, Waukee, IA (US);
James J. Phelan, Bettendorf, IA (US);
John M. Hageman, Silvis, IL (US);
Cristian Dima, Sankt Ingbert, GE;
Hanke Boesch, Tiefenthal, GE;
Herman Herman, Gibsonia, PA (US);
Zachary Abraham Pezzementi, Pittsburgh, PA (US);
Cason Robert Male, Pittsburgh, PA (US);
Joan Campoy, Pittsburgh, PA (US);
Carlos Vallespi-gonzalez, Pittsburgh, PA (US);
Deere & Company, Moline, IL (US);
Abstract
A method and non-transitory computer-readable medium capture an image of bulk grain and apply a feature extractor to the image to determine a feature of the bulk grain in the image. For each of a plurality of different sampling locations in the image, based upon the feature of the bulk grain at the sampling location, a determination is made regarding a classification score for the presence of a classification of material at the sampling location. A quality of the bulk grain of the image is determined based upon an aggregation of the classification scores for the presence of the classification of material at the sampling locations.