The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2017
Filed:
Feb. 15, 2013
Hitachi Maxell, Ltd., Ibaraki-shi, Osaka, JP;
Fumie Kusumoto, Ibaraki, JP;
Masashi Yoshimura, Ibaraki, JP;
Eiji Sakata, Ibaraki, JP;
Hironobu Nagano, Ibaraki, JP;
Kenji Matsuoka, Ibaraki, JP;
Kengo Miura, Ibaraki, JP;
HITACHI MAXELL, LTD., Osaka, JP;
Abstract
Service can be offered free of charge and the cost of a skin condition measuring device can be reduced by effectively using data on the occasion of obtaining an analysis result by transmitting measurement data by the skin condition measuring device to a server of a company providing a service of analyzing the measurement data. When a request is made from a contractor client to acquire data registered in a measurement data database, authentication is executed based on a contractor ID input from the contractor client. Additionally, when the measurement data database is searched from a contractor database based on the contractor ID, a search level and an access level are obtained. The contractor client is permitted to search the measurement data database within a range of the search level and the access level.