The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2017

Filed:

Jan. 20, 2012
Applicants:

Satoshi Michihata, Tokyo, JP;

Kiyoyasu Maruyama, Tokyo, JP;

Satoko Miki, Tokyo, JP;

Tomonori Fukuta, Tokyo, JP;

Kazuhiro Tanaka, Tokyo, JP;

Inventors:

Satoshi Michihata, Tokyo, JP;

Kiyoyasu Maruyama, Tokyo, JP;

Satoko Miki, Tokyo, JP;

Tomonori Fukuta, Tokyo, JP;

Kazuhiro Tanaka, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/30 (2006.01); G06F 11/07 (2006.01); G06F 13/42 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0751 (2013.01); G06F 13/4282 (2013.01);
Abstract

A slave device is equipped with: a parameter setting portion for setting different values according to the content of commands sent from a master device, as parameter values for detecting anomalies; and an anomaly detecting portion for detecting anomalies by comparing the time corresponding to a parameter value that has been set by the parameter setting portion and the measured time of a process carried out in response to a command.


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