The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2017

Filed:

Dec. 03, 2014
Applicant:

Shenzhen China Star Optoelectronics Technology Co., Ltd., Shenzhen, CN;

Inventors:

Zui Wang, Shenzhen, CN;

Shih Hsun Lo, Shenzhen, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F 1/1362 (2006.01); G02F 1/13 (2006.01); G01R 31/02 (2006.01); G09G 3/00 (2006.01);
U.S. Cl.
CPC ...
G02F 1/136259 (2013.01); G01R 31/02 (2013.01); G02F 1/13 (2013.01); G09G 3/006 (2013.01); G02F 2001/136254 (2013.01); G02F 2001/136263 (2013.01);
Abstract

An array substrate and a method for detecting the array substrate are disclosed. The array substrate comprises a display area and a detecting area. In a first detecting mode, a first to a sixth detecting circuits are divided into three groups, and a first detecting signal is successively provided to these three groups of detecting circuits, so that a circuit defect possibly existing in a charge line and a share line that are located in each row of subarea can be detected. In a second detecting mode, the first to the sixth detecting circuits are divided into two groups, and a second detecting signal is provided to the two groups of detecting circuits successively, so that a circuit defect possible existing in the charge line and the share line that are located in adjacent rows of subareas can be detected.


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