The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2017

Filed:

Sep. 09, 2015
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Ganesan Thiagarajan, Bangalore, IN;

Arup Polley, Richardson, TX (US);

Terry Lee Sculley, Lewisville, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 35/00 (2006.01); G01R 33/09 (2006.01); G01R 33/00 (2006.01);
U.S. Cl.
CPC ...
G01R 33/093 (2013.01); G01R 33/0035 (2013.01);
Abstract

Methods and apparatus for magnetic sensors and integrated calibration. In an example arrangement, a system includes a magnetic sensor configured to output a signal corresponding to magnetic fields; a calibration trace disposed proximal to the magnetic sensor; a controlled current source coupled to the calibration trace and configured to output a current resulting in a magnetic field output from the calibration trace; and a comparator coupled to the output signal from the magnetic sensor and to an expected signal. In the example arrangement, the comparator outputs a signal indicating whether the output signal from the magnetic sensor corresponds to the expected signal. Methods are also disclosed.


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