The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2017
Filed:
Jul. 21, 2014
California Institute of Technology, Pasadena, CA (US);
The Regents of the University of California, Oakland, CA (US);
John M. Gregoire, Sierra Madre, CA (US);
Jian Jin, Berkeley, CA (US);
Kevin S. Kan, Pasadena, CA (US);
Martin R. Marcin, Simi Valley, CA (US);
Slobodan Mitrovic, Pasadena, CA (US);
Paul F. Newhouse, Pasadena, CA (US);
Santosh K. Suram, Pasadena, CA (US);
Chengxiang Xiang, Costa Mesa, CA (US);
Lan Zhou, Pasadena, CA (US);
California Institute Of Technology, Pasadena, CA (US);
The Regents of the University of California, Oakland, CA (US);
Abstract
Various samples are generated on a substrate. The samples each includes or consists of one or more analytes. In some instances, the samples are generated through the use of gels or through vapor deposition techniques. The samples are used in an instrument for screening large numbers of analytes by locating the samples between a working electrode and a counter electrode assembly. The instrument also includes one or more light sources for illuminating each of the samples. The instrument is configured to measure the photocurrent formed through a sample as a result of the illumination of the sample.