The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2017
Filed:
Feb. 26, 2015
Korea Atomic Energy Research Institute, Daejeon, KR;
To Kang, Suwon-si, KR;
Jin-Ho Park, Daejeon, KR;
Doo-Byung Yoon, Daejeon, KR;
Soon-Woo Han, Hwaseong-si, KR;
Jang-Soo Lee, Daejeon, KR;
KOREA ATOMIC ENERGY RESEARCH INSTITUTE, Daejeon, KR;
Abstract
Provided are an apparatus and a method for measuring a nonlinearity parameter using laser, and more particularly, an apparatus and a method for measuring a nonlinearity parameter using laser for computing the nonlinearity parameter by irradiating laser of a toneburst signal on a surface of a sample by non-contact type laser so as to excite the sample, irradiating measurement laser beam on the surface of the sample so as to receive displacement information occurring on the surface of the sample over time, measuring the displacement in an interferometer principle, and performing a bandpass filtering for the measured signal so as to measure amplitude Aof a component of a fundamental frequency and amplitude Aof a component of a secondary harmonic wave.