The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2017

Filed:

Mar. 18, 2016
Applicant:

Bio Materials Analysis Technology Inc., Hsinchu County, TW;

Inventors:

Pin Chang, Hsinchu, TW;

Hung-Jen Chen, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/28 (2006.01); H01J 37/20 (2006.01); H01J 37/26 (2006.01); H01J 37/32 (2006.01);
U.S. Cl.
CPC ...
G01N 1/2813 (2013.01); H01J 37/20 (2013.01); H01J 37/26 (2013.01); H01J 37/32009 (2013.01);
Abstract

A sample collective device includes two substrates and a spacer. Each substrate has a first surface and a second surface, and the two substrates are arranged with the first surfaces facing each other. The spacer is disposed between the two first surfaces for bonding and fixing the two substrates and forming a sample containing space. In addition, each of the substrates includes a first weakening structure located in the periphery of the sample containing space and exposed on the first surface. A sample collective device array including a plurality of the aforementioned sample collective devices is also provided.


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