The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2017

Filed:

May. 11, 2012
Applicants:

Hiroaki Suzuki, Tajimi, JP;

Atsushi Kobayashi, Seto, JP;

Inventors:

Hiroaki Suzuki, Tajimi, JP;

Atsushi Kobayashi, Seto, JP;

Assignee:

MENICON CO., LTD., Nagoya-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/00 (2006.01); G01M 11/02 (2006.01); G02C 7/04 (2006.01);
U.S. Cl.
CPC ...
G01M 11/0228 (2013.01); G01M 11/0221 (2013.01); G02C 7/04 (2013.01);
Abstract

Provided are a lens power measurement device and a lens power measurement method whereby lens power measurement results of a contact lens can be displayed in a manner which is easy to view, while maintaining fully satisfactory precision of the lens power measurement results. From lens power distribution information determined based on optical property measurement information of a contact lens, correction target information including positive and negative abnormal peaks on both sides of a lens central axis in a lens central area is selected. Lens power distribution measurement results are then obtained by applying substitution using a correction function that smoothes out the abnormal peaks to the selected correction target information to smooth the lens power measurement values.


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