The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2017

Filed:

Jul. 08, 2015
Applicant:

Tecan Trading Ag, Männedorf, CH;

Inventors:

Lutz Niggl, Waging, DE;

Andreas Erlbacher, Grodig, AT;

Frank Münchow, Freilassing, DE;

Assignee:

TECAN TRADING AG, Männedorf, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/18 (2006.01); G01J 3/06 (2006.01); G01J 3/42 (2006.01); G01N 35/02 (2006.01); G01N 21/25 (2006.01); G01N 21/31 (2006.01); G01J 3/12 (2006.01);
U.S. Cl.
CPC ...
G01J 3/18 (2013.01); G01J 3/06 (2013.01); G01J 3/42 (2013.01); G01N 21/253 (2013.01); G01N 21/31 (2013.01); G01N 35/028 (2013.01); G01J 2003/1204 (2013.01); G01J 2003/1213 (2013.01); G01J 2003/1217 (2013.01); G01N 2021/3174 (2013.01); G01N 2201/084 (2013.01);
Abstract

A spectrometer () comprises a light source (), a monochromator () with at least one diffraction grating (), a monochromator housing (), an order sorting filter (), a microplate receptacle () and a controller (). The order sorting filter () of the spectrometer () comprises a substrate (), a first optical thin film () and a second optical thin film (), wherein, in a spatially partly overlapping and interference-free manner, the first optical thin film () is arranged on a first surface () and the second optical thin film () is arranged on a second surface () of the substrate (). A spectrometer () equipped with a respective order sorting filter is used in a scanning method for detecting the absorption spectrum of samples examined in wells () of microplates ().


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