The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2017
Filed:
May. 13, 2016
Applicant:
Eit, Llc, Sterling, VA (US);
Inventors:
Joe T. May, Leesburg, VA (US);
Mark Lawrence, Frederick, MD (US);
Assignee:
EIT, LLC, Sterling, VA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/42 (2006.01); G01J 1/04 (2006.01); G01J 1/02 (2006.01);
U.S. Cl.
CPC ...
G01J 1/429 (2013.01); G01J 1/0271 (2013.01); G01J 1/0474 (2013.01); G01J 1/0488 (2013.01);
Abstract
Instruments and methods are disclosed which measure absolute energy and irradiance of UV light sources. The response curves of exemplary optical stacks of the radiometry instruments are substantially rectangular with steep transitions at the cutoff frequencies. Angle of incidence (AOI) control in combination with one or more interference filters in the optical stack enable the full optical stack to produce repeatable and accurate measurements. Inverse response filters are disclosed for leveling optical stack response.