The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2017

Filed:

Apr. 15, 2014
Applicant:

Emerson Electric (Us) Holding Corporation (Chile) Limitada, Santiago, CL;

Inventors:

Raymond E. Garvey, III, Loudon, TN (US);

Joseph A. Vrba, Clinton, TN (US);

Stewart V. Bowers, III, Knoxville, TN (US);

Robert D. Skeirik, Knoxville, TN (US);

Hermann Holtmannspötter, Nordhein Westfalen, DE;

Michael D. Medley, Knoxville, TN (US);

Kevin Steele, Knoxville, TN (US);

Douglas A. Mann, Farragut, TN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
G01D 18/00 (2013.01);
Abstract

Useful and meaningful machine characteristic information may be derived through analysis of oversampled digital data collected using dynamic signal analyzers, such as vibration analyzers. Such data have generally been discarded in prior art systems. In addition to peak values and decimated values, other oversampled values are used that are associated with characteristics of the machine being monitored and the sensors and circuits that gather the data. This provides more useful information than has previously been derived from oversampled data within a sampling interval.


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