The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2017

Filed:

Oct. 09, 2014
Applicant:

Hexagon Technology Center Gmbh, Heerbrugg, CH;

Inventors:

Simon Bestler, Langenargen, DE;

Jochen Scheja, Heerbrugg, CH;

Jürg Hinderling, Marbach, CH;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01); G01C 15/00 (2006.01); G01S 17/06 (2006.01); G01S 17/02 (2006.01); G01S 17/42 (2006.01); G01S 7/48 (2006.01); G01S 7/481 (2006.01); G01S 7/497 (2006.01); G01S 7/51 (2006.01); G01S 17/89 (2006.01);
U.S. Cl.
CPC ...
G01C 15/008 (2013.01); G01C 15/002 (2013.01); G01S 7/4808 (2013.01); G01S 7/4813 (2013.01); G01S 7/4817 (2013.01); G01S 7/4972 (2013.01); G01S 7/51 (2013.01); G01S 17/023 (2013.01); G01S 17/06 (2013.01); G01S 17/42 (2013.01); G01S 17/89 (2013.01);
Abstract

Some embodiments of the invention relate to a surveying apparatus in the form of a scanner comprising a beam deflection unit, such a beam deflection unit and a measuring method to be carried out with said surveying apparatus. The surveying apparatus comprises a radiation source for generating measurement radiation and a detector for receiving reflected measurement radiation, called reflection radiation for short, which was reflected at an object of interest, wherein measurement radiation and reflection radiation have substantially the same optical path. Situated in said optical path there is a beam deflection unit mounted rotatably about a rotation axis and serving for adjustably aligning the measurement radiation and for capturing the reflected radiation.


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