The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2017
Filed:
Oct. 28, 2011
Applicants:
Gary J. Latham, Austin, TX (US);
Liangjing Chen, Austin, TX (US);
Andrew Hadd, Austin, TX (US);
Sachin Sah, Austin, TX (US);
RU Cao, Austin, TX (US);
Inventors:
Gary J. Latham, Austin, TX (US);
Liangjing Chen, Austin, TX (US);
Andrew Hadd, Austin, TX (US);
Sachin Sah, Austin, TX (US);
Ru Cao, Austin, TX (US);
Assignee:
Asuragen, Inc., Austin, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
C12P 19/34 (2006.01); C12Q 1/68 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/6883 (2013.01); C12Q 1/6858 (2013.01); C12Q 2600/154 (2013.01); C12Q 2600/166 (2013.01);
Abstract
Methods are provided for determining the methylation status of GC-rich templates. The methods include use of GC reference standards that allow simultaneous characterization of methylation status and CGG repeat length. The methods are useful for detecting genotypes associated with GC-rich repeats, including Fragile X Syndrome.