The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2017

Filed:

Jul. 22, 2016
Applicant:

E Ink Corporation, Billerica, MA (US);

Inventors:

Peter Carsten Bailey Widger, Nashua, NH (US);

Lynne A. McCullough, Medford, MA (US);

Russell J. Dewitte, Franklin, MA (US);

Richard J. Paolini, Jr., Framingham, MA (US);

Thomas Fauvell, Chicago, IL (US);

Jonathan Kim Nguyen, Rockland, MA (US);

Assignee:

E Ink Corporation, Billerica, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C09J 175/06 (2006.01); G01N 23/223 (2006.01); G02F 1/167 (2006.01); G02F 1/15 (2006.01);
U.S. Cl.
CPC ...
C09J 175/06 (2013.01); G01N 23/223 (2013.01); G02F 1/15 (2013.01); G02F 1/167 (2013.01); G01N 2223/633 (2013.01);
Abstract

Polymer formulations including urethane acrylates, adhesion promoters, and conductive monomers. By selecting suitable conductive monomers, it is possible to achieve formulations having a volume resistivity from 10to 10Ohm·cm after being conditioned for one week at 25° C. and 50% relative humidity. Such formulations are suitable for incorporation into electro-optic materials, such as electro-optic displays or variable transmission films, e.g., for architectural applications. In other embodiments, the formulations additionally include metal oxide nanoparticles to alter the refractive index and/or conductivity. The addition of certain metal nanoparticles additionally facilitates non-destructive measurement of layer thickness using X-ray fluorescence spectroscopy.


Find Patent Forward Citations

Loading…