The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2017

Filed:

Feb. 18, 2016
Applicant:

Guy M. Besson, Broomfield, CO (US);

Inventor:

Guy M. Besson, Broomfield, CO (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5205 (2013.01); A61B 6/032 (2013.01); A61B 6/4007 (2013.01); A61B 6/4452 (2013.01); A61B 6/035 (2013.01); A61B 6/54 (2013.01);
Abstract

A CT scanner has multiple X-ray sources on a first rotatable gantry disposed to illuminate an X-ray detector array. An image processor receives data from the detector array, machine readable instructions in the memory include instructions for energizing K>=2 X-ray sources simultaneously while rotating the gantry through multiple positions and recording measurements at each gantry position. Some measurements correspond to sums of line integrals of radiation from two or more of the X-ray sources as attenuated by passage through an imaging zone to detector array cells, including a first measurement Nat a first gantry position and a second measurement Nat a second gantry position represent a sum of line integrals comprising a line integral of attenuation of radiation along a same line L. Instructions determine individual line integrals along the line L from the measurements Nand Nthat include sums of line integrals along the line L.


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