The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2017
Filed:
Feb. 05, 2015
Applicant:
Moxtek, Inc., Orem, UT (US);
Inventors:
Vincent Floyd Jones, Cedar Hills, UT (US);
Daniel N. Paas, Spanish Fork, UT (US);
Assignee:
Moxtek, Inc., Orem, UT (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 35/16 (2006.01); H01J 37/16 (2006.01); H05G 1/04 (2006.01); H05G 1/02 (2006.01); G01N 23/223 (2006.01); G21F 5/02 (2006.01); G21F 5/04 (2006.01); G21F 5/06 (2006.01); A61B 6/00 (2006.01); A61B 6/10 (2006.01); G21F 1/10 (2006.01); H05G 1/06 (2006.01); G21F 5/015 (2006.01); H01J 5/50 (2006.01); H01J 5/04 (2006.01); H01J 9/36 (2006.01); H01J 35/02 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4405 (2013.01); A61B 6/107 (2013.01); A61B 6/4429 (2013.01); G01N 23/223 (2013.01); G21F 1/106 (2013.01); G21F 5/015 (2013.01); G21F 5/02 (2013.01); G21F 5/04 (2013.01); G21F 5/06 (2013.01); H01J 35/16 (2013.01); H01J 37/165 (2013.01); H05G 1/04 (2013.01); H05G 1/06 (2013.01); A61B 6/485 (2013.01); A61B 2560/0406 (2013.01); A61B 2560/0425 (2013.01); A61B 2560/0431 (2013.01); A61B 2560/0462 (2013.01); G01N 2223/076 (2013.01); G01N 2223/301 (2013.01); H01J 5/04 (2013.01); H01J 5/50 (2013.01); H01J 9/36 (2013.01); H01J 35/025 (2013.01); H01J 2235/16 (2013.01); H01J 2235/163 (2013.01); H01J 2235/165 (2013.01); H01J 2235/166 (2013.01); H01J 2237/0266 (2013.01);
Abstract
A portable XRF analyzer includes a hand shield to substantially block x-rays from impinging on a hand of a user. The portable XRF analyzer includes a heat sink over an x-ray source and a heat sink over an x-ray detector. The heat sinks are separated from each other by a thermally insulative material.