The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2017
Filed:
Oct. 06, 2015
Nidek Co., Ltd., Gamagori-shi, Aichi, JP;
Kazunari Shimizu, Toyokawa, JP;
NIDEK CO., LTD., Gamagori, JP;
Abstract
An ophthalmic apparatus obtains naked-eye wavefront aberration data of an examinee's eye measured by an aberration measuring unit, and calculates first corrected wavefront aberration data intended for a prescription with a first correction power based on the naked-eye wavefront aberration data and the first correction power and generates a first evaluation index based on the first corrected wavefront aberration data. The ophthalmic apparatus further calculates second corrected wavefront aberration data intended for a prescription with a second correction power different from the first correction power in at least one of spherical power, astigmatic power, and astigmatic axis angle based on the naked-eye wavefront aberration data and the second correction power, and generates a second evaluation index based on the second corrected wavefront aberration data. The ophthalmic apparatus then displays the first and second evaluation indexes selectively or in parallel on a monitor.