The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2017

Filed:

Dec. 15, 2016
Applicant:

Olympus Corporation, Tokyo, JP;

Inventors:

Keisuke Tsutsui, Kawaguchi, JP;

Fumiyuki Okawa, Tama, JP;

Hiroyuki Usami, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 9/47 (2006.01); A61B 1/00 (2006.01); A61B 1/04 (2006.01); G02B 23/24 (2006.01); H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
A61B 1/04 (2013.01); A61B 1/00009 (2013.01); A61B 1/00045 (2013.01); A61B 1/00114 (2013.01); A61B 1/00121 (2013.01); G02B 23/2484 (2013.01); H04N 17/002 (2013.01);
Abstract

An endoscope system includes a head portion, a connector portion and a CCU. The head portion includes a test signal generating portion configured to generate a first test pattern signal. The connector portion includes: a test signal generating portion configured to generate a second test pattern signal which is a same pattern signal as the first test pattern; a first comparison circuit configured to output a comparison result of comparing the first test pattern signal with the second test pattern signal; and a test signal generating portion configured to generate a third test pattern signal. The CCU includes: a test signal generating portion configured to generate a fourth test pattern signal which is a same pattern signal as the third test pattern; and a second comparison circuit configured to output a comparison result of comparing the third test pattern signal with the fourth test pattern signal.


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