The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2017

Filed:

Jan. 21, 2014
Applicant:

China Academy of Telecommunications Technology, Beijing, CN;

Inventors:

Ruiping Wei, Beijing, CN;

Meifang Jing, Beijing, CN;

Xin Su, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 7/06 (2006.01); H04W 24/08 (2009.01); H04B 7/0456 (2017.01); H04B 17/373 (2015.01); H04W 72/08 (2009.01); H04W 72/04 (2009.01); H04W 72/00 (2009.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); H04B 7/0456 (2013.01); H04B 17/373 (2015.01); H04W 72/044 (2013.01); H04W 72/08 (2013.01); H04W 72/00 (2013.01);
Abstract

Provided are a method and device for three-dimensional channel measurement resource configuration and quality measurement, which relate to the field of wireless communications and are used for solving the problem of how to perform three-dimensional channel quality measurement. In the present invention, a base station selects a channel quality measurement resource used for three-dimensional channel measurement from channel quality measurement resources preconfigured for a terminal, and sends indication information about the selected channel quality measurement resource to the terminal; the terminal receives the indication information, and performs three-dimensional channel quality measurement on corresponding channel quality measurement resources, thereby solving the problem of how to perform three-dimensional channel quality measurement.


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