The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2017
Filed:
Apr. 16, 2015
Electronics and Telecommunications Research Institute, Daejeon, KR;
Ji Ho Chang, Daejeon, KR;
Dae Hwan Hwang, Daejeon, KR;
Kwang Ho Yang, Gyeryong, KR;
Eul Gyoon Lim, Daejeon, KR;
Jae Il Cho, Daejeon, KR;
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE, Daejeon, KR;
Abstract
Disclosed are a system and method for performing distortion correction and calibration using a pattern projected by a projector. The system for performing distortion correction and calibration includes a projector that projects a pattern, at least one camera that generates a photographed pattern image by photographing an image onto which the pattern is projected, and an image processing device that calculates a calibration parameter by comparing an original pattern image projected by the projector and the photographed pattern image. Thus, it is possible to obtain an accurate depth image by easily utilizing an image for the pattern projected by the projector. In addition, when obtaining the depth image, the calibration parameter for correcting image distortion according to camera lens and a calibration state of cameras may be efficiently obtained using the pattern projected by the projector.