The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2017

Filed:

Jan. 16, 2016
Applicant:

Olympus Corporation, Shibuya-ku, Tokyo, JP;

Inventor:

Mitsutaka Kimura, Hachioji, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/228 (2006.01); G03B 17/00 (2006.01); H04N 5/232 (2006.01); H04N 5/262 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23229 (2013.01); H04N 5/23212 (2013.01); H04N 5/23293 (2013.01); H04N 5/2628 (2013.01); H04N 5/23216 (2013.01);
Abstract

An image pickup apparatus includes: an image pickup device arranged such that a light receiving surface is orthogonal to an optical axis of an image pickup lens, the image pickup device acquiring primary image data; an input device that receives input of correction angles including a first angle that is an angle formed in a pitch direction relative to the light receiving surface and a second angle that is an angle formed in a yaw direction relative to the light receiving surface; an image processing unit that uses a focal length of the image pickup lens and the correction angles to generate secondary image data obtained by applying a modification process of projecting the primary image data onto a plane forming the first angle in the pitch direction relative to the light receiving surface and the second angle in the yaw direction relative to the light receiving surface.


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