The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2017

Filed:

Sep. 29, 2014
Applicants:

Boe Technology Group Co., Ltd., Beijing, CN;

Beijing Boe Optoelectronics Technology Co., Ltd., Beijing, CN;

Inventors:

Zijin Lin, Beijing, CN;

Chaoyang Deng, Beijing, CN;

Chao Tian, Beijing, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01); G02B 13/00 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
H04N 5/2254 (2013.01); G01N 21/8851 (2013.01); G02B 13/0015 (2013.01); G01N 2021/888 (2013.01); G01N 2021/8861 (2013.01);
Abstract

The present invention provides a marking apparatus for a display panel and a marking method for a display panel. The marking device comprises an image acquiring module, a simulated marking module and a real marking module. A simulated marking line is drawn, by the simulated marking module, in an image acquired by the image acquiring module, of a region containing a position where a defect occurs on a display panel to be marked. The real marking module automatically draws a real marking line on the display panel to be marked according to the simulated marking line. Thus, a position where a defect occurs on a display panel to be marked is accurately marked, and it is convenient for an engineer to accurately locate and sample the defective position in the subsequent analysis process.


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