The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2017

Filed:

Jun. 07, 2013
Applicant:

Litepoint Corporation, Sunnyvale, CA (US);

Inventor:

Minh-Chau Huynh, San Mateo, CA (US);

Assignee:

LitePoint Corporation, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04B 17/29 (2015.01);
U.S. Cl.
CPC ...
H04B 17/008 (2013.01); H04B 17/29 (2015.01);
Abstract

A system and method for facilitating wireless testing of a radio frequency (RF) signal transceiver device under test (DUT). Using multiple antennas within a shielded enclosure containing the DUT, multiple wireless RF test signals resulting from a RF test signal radiated from the DUT can be captured and have their respective signal phases controlled in accordance with one or more signal characteristics, including their respective signal power levels, their respective signal phases as received, and a signal power level of a combination of the received signals. Such phase control of the captured wireless RF test signals can be performed individually for any DUT tested within the shielded enclosure, thereby providing compensation for the multipath signal environment within the shielded enclosure irrespective of the placement of the DUT, and thereby simulating a wired test signal path during wireless testing of the DUT.


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