The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2017
Filed:
Sep. 28, 2016
Board of Regents, the University of Texas System, Austin, TX (US);
BOARD OF REGENTS, THE UNIVERSITY OF TEXAS SYSTEM, Austin, TX (US);
Abstract
Disclosed herein are systems and methods that describe statistical estimation based noise reduction for SAR ADCs. For SAR ADCs, the conversion error can be available at the comparator input. Although a noisy 1-bit comparator may not be able to produce an accurate estimation for its input if used only once, the comparison can be repeated multiple times for a designated bit of the multi-bit SAR ADC. This can allow for the improvement of the estimation accuracy by examining the probability of the comparator output being '1' or '0'. The estimation of a signal from a noisy environment using multiple trials can be cast as a classic statistical estimation issue. In one aspect of the disclosure, an optimal Bayes estimator is disclosed to achieve a low estimation error from the comparator on a designated bit of the multi-bit SAR ADC.